Tera Prospector

  1. Manago, G., Tanabe, T., Okubo, K., Yu, J., & Iwamoto, T., "Identification of cast and extruded PMMA for sustainable recycling and using terahertz time domain spectrometer." International Journal of Sustainable Engineering 19.1 (2026): 2619247　New
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  2. Liu, S., Agulto, V. C., Kato, K., Iwamoto, T., Kumagai, Y., Murakami, H., ... & Nakajima, M., "Temperature Dependence of Conductivity Properties of Epitaxial Beta-Gallium Oxide Evaluated in Terahertz Region." 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2024.
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  3. Kobashi, H., Zhao, W., Agulto, V. C., Kato, K., Iwamoto, T., Miura, K., ... & Nakajima, M., "Terahertz time-domain spectroscopy of tooth components for caries diagnosis." 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2024.
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  4.  Liu, S., Agulto, V. C., Iwamoto, T., Kato, K., Ota, M., Goto, K., ... & Nakajima, M., "Temperature Dependence of the Anisotropic Dielectric Properties of Semiinsulating β-Ga 2 O 3 in the Terahertz Region." 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2023.
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  5.  Komatsu, K., Iwamoto, T., Ito, H., & Saitoh, H., "THz gas sensing using terahertz time-domain spectroscopy with ceramic architecture." ACS omega 7.35 (2022): 30768-30772.
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  6. Agulto, V. C., Toya, K., Phan, T. N. K., Mag-Usara, V. K., Li, J., Empizo, M. J. F., ... & Nakajima, M., "THz Spectroscopy of the Anisotropic Refractive Index of β-Ga 2 O 3." 2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz). IEEE, 2021.
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Tera Evaluator

  1. Okamoto, A., Nagai, M., Ashida, M., & Fujii, T.," Modeling terahertz magneto-optical spectroscopic ellipsometry with conductive sheet approximation for semiconductor thin films." Optics Letters 51.2(2026): 441-444.　New
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  2. Wang, D., Fujii, T., Deura, M., Iwamoto, T., Sugie, R., Suyama, A., ... & Araki, T., "Noncontact and nondestructive measurements of electrical properties for Mg ion-implanted layers on GaN single crystals using THz time-domain spectroscopic ellipsometry." MRS Advances (2025): 1-7.
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  3.  Agulto, V. C., Iwamoto, T., Zhao, Z., Liu, S., Kato, K., & Nakajima, M., "Wafer-scale mapping of carrier density and mobility with terahertz time-domain ellipsometry." Optics Letters 50.3 (2025): 948-951.
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  4. Watanabe, H., Wang, D., Fujii, T., Iwamoto, T., Fukuda, T., Deura, M., & Araki, T., "Investigation of Nondestructive and Noncontact Electrical Characterization of GaN Thin Film on ScAlMgO4 Substrate Using Terahertz Time‐Domain Spectroscopic Ellipsometry with Characteristic Impedance Analytical Model." physica status solidi (b) 261.11 (2024): 2400017.
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  5. Zhao, Z., Agulto, V. C., Iwamoto, T., Kato, K., Yamanoi, K., Shimizu, T., ... & Nakajima, M., "Investigation of the optical and electrical properties of zinc oxide by terahertz time domain ellipsometry." Optical Materials: X 24 (2024): 100352.
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  6. Zhao, Z., Agulto, V. C., Iwamoto, T., Kato, K., Yamanoi, K., Shimizu, T., ... & Nakajima, M., "Study of c-and m-plane properties of ZnO via terahertz time-domain ellipsometry." JSAP-Optica Joint Symposia. Optica Publishing Group, 2024.
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  7. Makino, K., Agulto, V. C., Hatayama, S., Kato, K., Iwamoto, T., & Nakajima, M., "Characterization of Dielectric Properties of Metal Films in Terahertz Frequency Range." 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2024.
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  8.  Zhao, Z., Agulto, V. C., Iwamoto, T., Kato, K., Yamanoi, K., Shimizu, T., ... & Nakajima, M., "Application of terahertz time-domain ellipsometry to the characterization of c-and m-surface in ZnO." 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2024.
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  9. Agulto, V. C., Iwamoto, T., Zhao, Z., Liu, S., Kato, K., & Nakajima, M., "Mapping of Semiconductor Electrical Properties with Terahertz Time-Domain Ellipsometry." 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2024.
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  10. Wang, J., Cai, W., Lu, W., Lu, S., Kano, E., Agulto, V. C., ... & Amano, H., "Observation of 2D-magnesium-intercalated gallium nitride superlattices." Nature 631.8019 (2024): 67-72.
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  11.  Iwamoto, T., Agulto, V. C., Liu, S., Wang, Y., Mag-usara, V. K., Fujii, T., ... & Nakajima, M., "Characterization of electrical properties of β-Ga2O3 epilayer and bulk GaAs using terahertz time-domain ellipsometry." Japanese Journal of Applied Physics 62.SF (2023): SF1011.
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  12. Nakanishi, A., Agulto, V. C., Kato, K., Iwamoto, T., Satozono, H., & Nakajima, M., "Optical properties of wood biomass material obtained by terahertz ellipsometry." 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2023.
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  13. Agulto, V. C., Iwamoto, T., Mag-Usara, V. K., & Nakajima, M., "Development of Terahertz Time-Domain Rotating-Analyzer Ellipsometry." Conference on Lasers and Electro-Optics/Pacific Rim. Optica Publishing Group, 2022.
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  14.  Agulto, V. C., Iwamoto, T., Wang, Y., Liu, S., Mag-Usara, V. K., Goto, K., ... & Nakajima, M., "Terahertz Time-Domain Ellipsometry of Heavily Doped β-Ga 2 O 3." 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz). IEEE, 2022.
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  15. Agulto, V. C., Iwamoto, T., Kitahara, H., Toya, K., Mag-Usara, V. K., Imanishi, M., ... & Nakajima, M., "Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm− 3." Scientific Reports 11.1 (2021): 18129.
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  16. Agulto, V. C., Iwamoto, T., Toya, K., Mag-usara, V. K., Imanishi, M., Goto, K., ... & Nakajima, M., "Terahertz time-domain spectroscopy of wide-bandgap semiconductors GaN and β-Ga2O3." Twelfth International Conference on Information Optics and Photonics. Vol. 12057. SPIE, 2021.
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  17. Kojima, S., Iwamoto, T., & Satou, Y., "Lattice instability of B-site substituted SrTiO3 crystals studied by terahertz time-domain spectroscopic ellipsometry." Japanese Journal of Applied Physics 60.SF (2021): SFFA06.
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  18. Agulto, V. C., Iwamoto, T., Kitahara, H., Toya, K., Mag-Usara, V. K., Imanishi, M., ... & Nakajima, M., "Measurement of optically dense semiconductor with 1020 cm-3 carrier density by terahertz time-domain ellipsometry." JSAP-OSA Joint Symposia. Optica Publishing Group, 2021.
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  19. Agulto, V. C., Toya, K., Phan, T. N. K., Mag-usara, V. K., Li, J., Empizo, M. J. F., ... & Nakajima, M., "Anisotropic complex refractive index of β-Ga2O3 bulk and epilayer evaluated by terahertz time-domain spectroscopy." Applied Physics Letters 118.4 (2021).
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  20. Agulto, V. C., Iwamoto, T., Toya, K., Mag-Usara, V. K., Dolas, S., Newman, N., ... & Nakajima, M., "Spectroscopic Ellipsometry of InSb in the Terahertz Region." 2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz). IEEE, 2021.
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  21. Kojima, S., Iwamoto, T., & Satou, Y., "Study of A-site substituted quantum paraelectric strontium titanate crystals by terahertz time-domain spectroscopic ellipsometry." Japanese Journal of Applied Physics 59.SP (2020): SPPA02.
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  22. Nakajima, M., Iwamoto, T., Kitahara, H., Toya, K., Mag-Usara, V. K. P., Koike, Y., ... & Yoshimura, M., "Evaluation for GaN single crystals with high doping concentration by the terahertz ellipsometry." 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2020.
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  23. Morino, K., Arakawa, S., Fujii, T., Mouri, S., Araki, T., & Nanishi, Y., "Characterization of the electrical properties of an InN epilayer using terahertz time-domain spectroscopic ellipsometry." Japanese Journal of Applied Physics 58.SC (2019): SCCB22.
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  24. Tachi, K., Asagami, S., Fujii, T., Araki, T., Nanishi, Y., Nagashima, T., ... & Kamiyama, S., "Measurement of the properties of GaN layers using terahertz time‐domain spectroscopic ellipsometry." physica status solidi (b) 254.8 (2017): 1600767.
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  25.  Fujii, T., Tachi, K., Araki, T., Nanishi, Y., Iwamoto, T., Sato, Y., & Nagashima, T., "Characterization of electric properties for wide-gap semiconductors using terahertz time-domain elipsometry." IEICE Technical Report; IEICE Tech. Rep. 116.357 (2016): 103-106.
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